Science Tweets on Photochemistry

Collection: INSTRUMENTS FOR SPECTROSCOPY RESEARCH

  • A protein crystal in the beamline

    Positioning of a protein crystal in the beamline ready for data collection.

    Created by:

    © Denis Morel, ESRF

    Source
    http://www.lightsources.org/imagebank/images/ESR090m.jpg

  • Near-field optical microscope- spectrometer

    This is a customized analytical instrument designed and built by Steve Smith of National Renewable Energy Laboratory. The instrument is used for nanoscale characterization and for fundamental analysis of electron dynamics and interactions.

    Created by:

    © Gretz, Warren - NREL Staff Photographer

    Source
    http://www.nrel.gov/data/pix/Gifs/04540.gif

  • NIR spectroscopy instrument

    NIR spectroscopy corresponds to the measurement of the wavelength and intensity of the absorption of near-infrared light by a sample. Near-infrared light spans between 800 nm - 2.5 µm (12,500 - 4000 cm-1) range and is energetic enough to excite overtones and combinations of molecular vibrations to higher energy levels.

    Created by:

    © Biotechayur, 2011

    Source
    http://www.ayurbiotech.com/Images/gallery3b.gif

  • A researcher at work using a secondary ion mass spectrometer (SIMS)

    A researcher of the National Renewable Energy Laboratory (Bob Reedy), works at a secondary ion mass spectrometer (SIMS) at the Solar Energy Research Facility (SERF). SIMS is used to analyze the surface of a material or to determine the depth distribution of elements as the primary ion beam sputters through a material. It can identify materials from the lightest of elements up to those having 250 a.m.u. (atomic mass unit).

    Created by:

    © Yost, Jim - NREL Contract Photographer

    Source
    http://www.nrel.gov/data/pix/Jpegs/02009.jpg

  • Time-of-flight secondary ion mass spectrometer (TOF SIMS)

    The TOF SIMS is used to identify materials that have atomic mass units (a.m.u.) ranging from less than 250 to greater than 10,000 a.m.u.

    Created by:

    © Yost, Jim - NREL Contract Photographer

    Source
    http://www.nrel.gov/data/pix/Jpegs/02014.jpg

  • X-ray photoelectron spectroscopic system (XPS)

    This spectroscopic system at National Renewable Energy Laboratory collects information on solid-state materials. By use of this instrument, we can measure and characterize anything of interest in photovoltaics all the way from the miniscule size of atoms in the most esoteric of solid state materials to the macroscale output of array fields.

    Created by:

    © Yost, Jim - NREL Contract Photographer

    Source
    http://www.nrel.gov/data/pix/Jpegs/01436.jpg